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Atomic layer deposition of epitaxial ferroelectric barium titanate on Si(001) for electronic and photonic applications

机译:基于Si(001)外延铁电钡的原子层沉积,用于电子和光子应用

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摘要

Epitaxial barium titanate (BTO) thin films are grown on strontium titanate-buffered Si(001) using atomic layer deposition (ALD) at 225 degrees C. X-ray diffraction confirms compressive strain in BTO films after the low temperature growth for films as thick as 66nm, with the BTO c-axis oriented in the out-of-plane direction. Postdeposition annealing above 650 degrees C leads to an in-plane c-axis orientation. Piezoresponse force microscopy was used to verify the ferroelectric switching behavior of ALD-grown films. Electrical and electro-optic measurements confirm BTO film ferroelectric behavior in out-of-plane and in-plane directions, respectively, at the micrometer scale.
机译:在225℃的原子层沉积(ALD)在225℃下,在钛酸锶缓冲Si(001)上生长在钛酸锶缓冲的Si(001)上。X射线衍射在低温生长后确认BTO薄膜中的压缩菌株为厚度为66nm,与平面外方向取向BTO C轴。在650度以上的后沉积退火导致面内C轴取向。压电响应力显微镜用于验证ALD生长薄膜的铁电切换行为。电气和电光测量分别在千分尺刻度上分别在平面外和面内方向上确认BTO膜铁电行为。

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  • 来源
    《Journal of Applied Physics》 |2019年第6期|064101.1-064101.9|共9页
  • 作者单位

    Univ Texas Austin Dept Chem Engn Austin TX 78712 USA|Lam Res Corp Fremont CA 94538 USA;

    Univ Texas Austin Dept Phys Austin TX 78712 USA;

    Univ Texas Austin Dept Phys Austin TX 78712 USA;

    Univ Texas Austin Dept Phys Austin TX 78712 USA;

    IBM Res Zurich CH-8803 Ruschlikon Switzerland;

    IBM Res Zurich CH-8803 Ruschlikon Switzerland;

    Univ Texas Austin Dept Phys Austin TX 78712 USA;

    Univ Texas Austin Dept Phys Austin TX 78712 USA;

    Univ Texas Austin Dept Chem Engn Austin TX 78712 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 22:17:05

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