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首页> 外文期刊>Journal of Computational Electronics >RF analysis and noise characterization of junctionless nanowire FETs by a Boltzmann transport equation solver
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RF analysis and noise characterization of junctionless nanowire FETs by a Boltzmann transport equation solver

机译:玻尔兹曼输运方程求解器对无结纳米线FET进行射频分析和噪声表征

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摘要

The junctionless nanowire field-effect transistor (JN-FET) stands out among the most promising architectures for future MOSFETs. While a fair amount of the published literature has focused on the static performance of JN-FETs, detailed numerical investigation of their RF small-signal and noise behavior on the device level still lacks. This paper reports the ac and noise characteristics of JN-FETs with different gate lengths and shows that due to the improved electrostatic control and better immunity to short-channel effects, several key quantities such as the drain/gate excess noise factors and correlation coefficient demonstrate classical long-channel behavior for channel lengths as small as 16 nm. The results are obtained using an in-house simulation tool, which provides the deterministic and self-consistent solution of the multi-subband Poisson, Schrodinger, and Boltzmann equations.
机译:无结纳米线场效应晶体管(JN-FET)在未来MOSFET的最有前途的架构中脱颖而出。尽管大量已发表的文献集中于JN-FET的静态性能,但仍缺乏在器件级对其RF小信号和噪声行为的详细数值研究。本文报道了不同栅极长度的JN-FET的交流和噪声特性,并表明由于改善了静电控制和对短沟道效应的抵抗力,一些关键参数(如漏极/栅极过大的噪声系数和相关系数)得到了证明。通道长度小至16 nm的经典长通道行为。结果是使用内部仿真工具获得的,该工具可提供多子带Poisson,Schrodinger和Boltzmann方程的确定性和自洽解。

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