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What we talk about when we talk about capacitance measured with the voltage-clamp step method

机译:当我们谈论使用电压钳阶跃法测量的电容时所谈论的

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Capacitance is a fundamental neuronal property. One common way to measure capacitance is to deliver a small voltage-clamp step that is long enough for the clamp current to come to steady state, and then to divide the integrated transient charge by the voltage-clamp step size. In an isopotential neuron, this method is known to measure the total cell capacitance. However, in a cell that is not isopotential, this measures only a fraction of the total capacitance. This has generally been thought of as measuring the capacitance of the "well-clamped" part of the membrane, but the exact meaning of this has been unclear. Here, we show that the capacitance measured in this way is a weighted sum of the total capacitance, where the weight for a given small patch of membrane is determined by the voltage deflection at that patch, as a fraction of the voltage-clamp step size. This quantifies precisely what it means to measure the capacitance of the "well-clamped" part of the neuron. Furthermore, it reveals that the voltage-clamp step method measures a well-defined quantity, one that may be more useful than the total cell capacitance for normalizing conductances measured in voltage-clamp in nonisopotential cells.
机译:电容是一种基本的神经元特性。一种测量电容的常用方法是提供一个小的电压钳位阶跃,该步长足以使钳位电流达到稳态,然后将积分的瞬态电荷除以电压钳位阶跃大小。在等势神经元中,已知该方法可测量总细胞电容。但是,在非等电位单元中,这仅占总电容的一小部分。通常认为这是测量膜的“良好钳位”部分的电容,但是其确切含义尚不清楚。在这里,我们表明以这种方式测量的电容是总电容的加权总和,其中给定小片膜片的重量由该片片上的电压偏转决定,即电压钳位步长的一部分。这精确地量化了测量神经元“良好钳位”部分的电容的含义。此外,它揭示了电压钳位方法测量的是一个明确定义的数量,该数量可能比总电池电容更有用,用于归一化非等电位电池中电压钳位中测得的电导。

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