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首页> 外文期刊>Journal of Computing and Information Science in Engineering >Using Tolerance-Maps to Generate Frequency Distributions of Clearance and Allocate Tolerances for Pin-Hole Assemblies
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Using Tolerance-Maps to Generate Frequency Distributions of Clearance and Allocate Tolerances for Pin-Hole Assemblies

机译：使用公差图来生成间隙的频率分布并为针孔组件分配公差

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摘要

A new mathematical model for representing the geometric variations of lines is extended to include probabilistic representations of one-dimensional (1D) clearance, which arise from positional variations of the axis of a hole, the size of the hole, and a pin-hole assembly. The model is compatible with the ASME/ ANSI/ISO Standards for geometric tolerances. Central to the new model is a Tolerance-Map (T-Map) (Patent No. 69638242), a hypothetical volume of points that models the 3D variations in location and orientation for a segment of a line (the axis), which can arise from tolerances on size, position, orientation, and form. Here, it is extended to model the increases in yield that occur when maximum material condition (MMC) is specified and when tolerances are assigned statistically rather than on a worst-case basis; the statistical method includes the specification of both size and position tolerances on a feature. The frequency distribution of 1D clearance is decomposed into manufacturing bias, i.e., toward certain regions of a Tolerance-Map, and into a geometric bias that can be computed from the geometry of multidimensional T-Maps. Although the probabilistic representation in this paper is built from geometric bias, and it is presumed that manufacturing bias is uniform, the method is robust enough to include manufacturing bias in the future. Geometric bias alone shows a greater likelihood of small clearances than large clearances between an assembled pin and hole. A comparison is made between the effects of choosing the optional material condition MMC and not choosing it with the tolerances that determine the allowable variations in position.
机译：扩展了一种用于表示线的几何变化的新数学模型，以包括一维（1D）间隙的概率表示，该误差表示是由于孔的轴线，孔的大小和针孔组件的位置变化而引起的。该模型与ASME / ANSI / ISO标准的几何公差兼容。新模型的核心是公差图（T-Map）（专利号69638242），该点的假想体积可以为线段（轴）的位置和方向的3D变化建模，尺寸，位置，方向和形状的公差。在这里，它被扩展为模拟当指定最大材料条件（MMC）并以统计方式而不是在最坏情况下分配公差时发生的产量增加。统计方法包括特征尺寸和位置公差的规范。一维间隙的频率分布分解为制造偏差（即朝向公差图的某些区域）和可从多维T图的几何计算得出的几何偏差。尽管本文中的概率表示是基于几何偏差构建的，并且假定制造偏差是均匀的，但该方法足够强大，可以在将来包含制造偏差。单独的几何偏差比在已组装的销和孔之间的大间隙显示出更大的可能性。在选择可选材料条件MMC与未选择确定条件允许的公差的公差之间进行比较。

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