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Effects of TMSb overpressure on InSb surface morphology for InSb epitaxial growth using low pressure metalorganic chemical vapor deposition

机译:TMSb超压对低压金属有机化学气相沉积InSb外延生长InSb表面形态的影响

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摘要

We investigated the effects of antimony (Sb) overpressure during thermal cleaning (TC) on the surface morphology of InSb substrates using low pressure metalorganic chemical vapor deposition (LP-MOCVD). During the TC process under H_2 ambient, indium (In) droplets were observed inside etch pits on InSb (001) surfaces due to the Sb evaporation from InSb substrates. On the other hand, when InSb substrates were thermally cleaned under trimethylantimony (TMSb) ambient, the formation of In droplets and the etch pits were suppressed, resulting in the smooth InSb surface. The surface morphology of InSb was dependent on TC temperature. Rough surface morphology was observed at low TC temperature of 435℃ and it became smoother with increasing TC temperature. The improvement of surface morphology was caused by the surface stabilization with increasing Sb flux and the increase of adatom migration. The dependence of TMSb flow rate on the surface morphology was also investigated. The TMSb overpressure during the TC of InSb must be maintained to grow high quality InSb epitaxial layers with smooth surface using MOCVD.
机译:我们使用低压金属有机化学气相沉积(LP-MOCVD)研究了热清洗(TC)过程中锑(Sb)超压对InSb衬底表面形态的影响。在H_2环境下进行TC过程中,由于Sb从InSb衬底上蒸发,在InSb(001)表面的蚀刻坑内观察到铟(In)小滴。另一方面,当在三甲基锑(TMSb)环境下对InSb基板进行热清洗时,可以抑制In液滴的形成和蚀刻坑的形成,从而获得平滑的InSb表面。 InSb的表面形态取决于TC温度。在435℃较低的TC温度下观察到粗糙的表面形貌,并随着TC温度的升高变得更光滑。表面形态的改善是由于表面稳定随着Sb通量的增加和原子迁移的增加而引起的。还研究了TMSb流量对表面形态的依赖性。必须使用MOCVD在InSb的TC期间保持TMSb超压,以生长出具有光滑表面的高质量InSb外延层。

著录项

  • 来源
    《Journal of Crystal Growth》 |2014年第1期|518-522|共5页
  • 作者单位

    Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 151-744, Korea,WCU Hybrid Materials Program, Department of Materials Science and Engineering, Seoul National University, Seoul 151-744, Korea;

    Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 151-744, Korea,WCU Hybrid Materials Program, Department of Materials Science and Engineering, Seoul National University, Seoul 151-744, Korea;

    Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 151-744, Korea;

    Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 151-744, Korea;

    Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 151-744, Korea;

    WCU Hybrid Materials Program, Department of Materials Science and Engineering, Seoul National University, Seoul 151-744, Korea,Department of Photonics, Ritsumeikan University, Shiga 525-8577, Japan;

    Energy Semiconductor Research Center, Advanced Institutes of Convergence Technology, Seoul National University, Suwon 443-270, Korea;

    Department of Materials Science and Engineering and Inter-university Semiconductor Research Center, Seoul National University, Seoul 151-744, Korea,WCU Hybrid Materials Program, Department of Materials Science and Engineering, Seoul National University, Seoul 151-744, Korea,Energy Semiconductor Research Center, Advanced Institutes of Convergence Technology, Seoul National University, Suwon 443-270, Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A1. Surfaces; A3. Metalorganic chemical vapor deposition; B1. Antimonides; B2. Semiconducting indium compounds; B2. Semiconducting Ⅲ-Ⅴ materials; B3. Infrared devices;

    机译:A1。表面;A3。金属有机化学气相沉积;B1。锑化物;B2。半导体铟化合物;B2。半导体Ⅲ-Ⅴ材料;B3。红外线设备;

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