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首页> 外文期刊>Journal of Crystal Growth >Compound-source molecular beam epitaxy of GaN using GaN powder and ammonia as sources
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Compound-source molecular beam epitaxy of GaN using GaN powder and ammonia as sources

机译:以GaN粉和氨为源的GaN化合物源分子束外延

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摘要

Compound-source molecular beam epitaxy (CS-MBE) of GaN layers using GaN powder and ammonia as sources is discussed. In particular, the reduction of excess Ga in GaN layers by introducing ammonia supply is discussed on the basis of their refraction high-energy electron diffraction (RHEED) patterns, X-ray photoelectron spectroscopy (XPS) spectra and atomic force microscopy (AFM) images. It was clarified that the ammonia supply is effective for the high growth rate of GaN layers and for the reduction of their oxygen concentration. During the growth, the surface migration of Ga atoms is limited by the ammonia supply.
机译:讨论了以GaN粉和氨为源的GaN层的化合物源分子束外延(CS-MBE)。特别是,基于其氨的折射高能电子衍射(RHEED)模式,X射线光电子能谱(XPS)光谱和原子力显微镜(AFM)图像,讨论了通过引入氨气供应来减少GaN层中多余的Ga的方法。 。明确了氨供给对于GaN层的高生长速率及其氧浓度的降低是有效的。在生长过程中,Ga原子的表面迁移受到氨气供应的限制。

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