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首页> 外文期刊>Journal of Crystal Growth >Epitaxila vawriations of Ni films grown on MgO(0 0 1)
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Epitaxila vawriations of Ni films grown on MgO(0 0 1)

机译：在MgO（0 0 1）上生长的Ni膜的外延生长

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Epitaxial Ni films were deposited on (0 0 1)MgO by DC magnetron sputtering under ultra-high vacuum condtions for studies involving magnetic-multilayer applications. The depostion temepratures of the Ni films studied in this work were 100 and 400 deg C. Examination bhytransmission electron microscopy (TEM) and electron diffracion revealed thatt the film deposited at the lower temeprature was predomiantely Ni[0 0 1]‖MgO[0 0 1] and Ni(0 1 0)‖MgO(0 1 0) oriented and smooth, a sexpected. However, the higher temeprautre films were predomiantely of the Ni[7 5 1]‖MgO[0 0 1] and Ni(1 1 2)‖MgO(1 0 0) orientation and facetted. The [7 5 1] orientation has been confirmed by X-ray diffracion, where this orientation was observed to be four-fold degenerate. For each of these four orientaitons there also existed a twin orientation, reflected about the MgO(1 0 0) planes, giving eight possible orientaitons for the Ni crystallites on MgO. This [7 5 1] epitaxial relatiosnhip was studied by dark-field TEM and electron diffraction. Because there films were polycrystalline and hence produced many diffraciton spots form both the the Ni and MgO with similr lawttice spacings. electron diffraciton patterns of the films were indexed using an electron diffraction image processing (EDIP) technique. Inthis techqiue, the polycrystalline electron diffraciton pattern was coverted into a graph, with the x-axis displaying lattice spacings and the y-axis, integrated intensity.
机译：通过直流磁控溅射在超高真空条件下将外延Ni膜沉积在（0 0 1）MgO上，用于涉及多层磁性应用的研究。这项研究中研究的镍膜的变形温度为100和400℃。检查透射电子显微镜（TEM）和电子衍射表明，沉积在较低温度的膜主要是Ni [0 0 1]” MgO [0 0 1]且Ni（0 1 0）‖MgO（0 1 0）取向且光滑，具有性别差异。然而，较高的替米普拉特膜主要以Ni [7 5 1]” MgO [0 0 1]和Ni（1 1 2）” MgO（1 0 0）取向且具有小平面。 [7 5 1]方向已通过X射线衍射确认，该方向被观察到是简并的四倍。对于这四个取向的每一个，还存在一个孪晶取向，围绕MgO（1 0 0）平面反射，从而为MgO上的Ni微晶提供了八种可能的取向。通过暗场TEM和电子衍射研究了这种[7 5 1]外延相关性。因为那里的薄膜是多晶的，因此从镍和氧化镁中都产生了具有相似的法线间距的许多衍射斑点。使用电子衍射图像处理（EDIP）技术对薄膜的电子衍射图样进行索引。在该技术中，将多晶电子衍射图样覆盖到图形中，其中x轴显示晶格间距，y轴显示积分强度。

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