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Image Quality Analysis of X-ray Grating Interferometer Using Integrating-bucket Method

机译：X射线光栅干涉仪使用积分桶法的图像质量分析

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摘要

Grating-based x-ray phase-contrast imaging has the potential to enhance image quality and provide inner structure details non-destructively. In this work, using grating-based x-ray phase-contrast imaging system and employing integrating-bucket method, the quantitative expressions of signal-to-noise ratios due to photon statistics and mechanical error are analyzed in detail. Photon statistical noise and mechanical error are the main sources affecting the image noise in x-ray grating interferometry. Integrating-bucket method is a new phase extraction method translated to x-ray grating interferometry; hence, its image quality analysis would be of great importance to get high-quality phase image. The authors' conclusions provide an alternate method to get high-quality refraction signal using grating interferometer, and hence increases applicability of grating interferometry in preclinical and clinical usage. (C) 2020 Society for Imaging Science and Technology.
机译：光栅的X射线相位对比度成像具有增强图像质量的潜力，并非破坏性地提供内部结构细节。在这项工作中，利用基于光栅的X射线相位对比度成像系统和采用集成桶方法，详细地分析了由于光子统计和机械误差引起的信噪比的定量表达。光子统计噪声和机械误差是影响X射线光栅干涉法中的图像噪声的主要源。集成桶法是一种转换为X射线光栅干涉测量的新相萃取方法;因此，它的图像质量分析将非常重要，以获得高质量的相位图像。作者的结论提供了一种使用光栅干涉仪获得高质量折射信号的替代方法，因此提高了光栅干涉测量的适用性在临床前和临床用途中。 （c）2020年影像科技协会。

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  • 来源
    《Journal of Imaging Science and Technology》 |2020年第2期|020503.1-020503.5|共5页
  • 作者

    Wali Faiz; Wang Shenghao; Li Ji; Huang Jianheng; Lei Yaohu; Wu Zhao; Zhu Peiping; Liu Jinyuan;

  • 作者单位

    Shenzhen Univ Coll Phys & Optoelect Engn Minist Educ & Guangdong Prov Key Lab Optoelect Devices & Syst Shenzhen 518060 Peoples R China;

    Chinese Acad Sci Shanghai Inst Opt & Fine Mech Key Lab Mat High Power Laser Shanghai 201800 Peoples R China;

    Shenzhen Univ Coll Phys & Optoelect Engn Minist Educ & Guangdong Prov Key Lab Optoelect Devices & Syst Shenzhen 518060 Peoples R China;

    Shenzhen Univ Coll Phys & Optoelect Engn Minist Educ & Guangdong Prov Key Lab Optoelect Devices & Syst Shenzhen 518060 Peoples R China;

    Shenzhen Univ Coll Phys & Optoelect Engn Minist Educ & Guangdong Prov Key Lab Optoelect Devices & Syst Shenzhen 518060 Peoples R China;

    Univ Sci & Technol China Natl Synchrotron Radiat Lab Hefei 230029 Peoples R China;

    Chinese Acad Sci Inst High Energy Phys Beijing 100049 Peoples R China|Univ Chinese Acad Sci Beijing 100049 Peoples R China;

    Shenzhen Univ Coll Phys & Optoelect Engn Minist Educ & Guangdong Prov Key Lab Optoelect Devices & Syst Shenzhen 518060 Peoples R China;

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