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Deposition of rare earth tantalate buffers on textured Ni-W substrates for YBCO coated conductor using chemical

机译:使用化学方法在用于YBCO涂层导体的纹理Ni-W衬底上沉积稀土钽酸盐缓冲剂

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摘要

Epitaxial films of rare-earth (RE = La, Ce, Eu, and Gd) tantalates, RE_3TaO_7 with pyrochlore structures were grown on biaxially textured nickel-3 at. percent tungsten (Ni-W) substrates using chemical solution deposition (CSD) process. Precursor solution of 0.3-0.4 M concentration of total cations were spin coated on to short samples of Ni-W substrates and the films were crystallized at 1050-1100 deg C in a gas mixture of Ar- 4 percent H_2 for 15 to 60 min. X-ray studies show that the films of pyrochlore RE tantalate films are highly textured with cube-on-cube epitaxy. Improved texture was observed in case of lanthanum tantalate (La_3TaO_7) film grown on Ni-W substrates. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) investigations of RE_3TaO_7 films reveal a fairly dense and smooth microstructure without cracks and porosity. The rare-earth tantalate layers may be potentially used as buffer layers for YBa_2Cu_3O_(7-sigma) (YBCO) coated conductors.
机译:稀土(稀土= La,Ce,Eu和Gd)钽酸盐的外延膜RE_3TaO_7具有烧绿石结构,生长在双轴织构的Nickel-3上。百分比的钨(Ni-W)基板使用化学溶液沉积(CSD)工艺。将总阳离子浓度为0.3-0.4 M的前体溶液旋涂到Ni-W衬底的短样品上,并在1050%到1100摄氏度的Ar-4%H_2混合气体中使薄膜结晶15至60分钟。 X射线研究表明,烧绿石RE钽酸盐薄膜的膜具有多维立方外延结构。在Ni-W衬底上生长钽酸镧(La_3TaO_7)膜的情况下,观察到质地得到改善。 RE_3TaO_7膜的扫描电子显微镜(SEM)和原子力显微镜(AFM)研究显示出相当致密且光滑的微观结构,没有裂纹和孔隙。稀土钽酸盐层可以潜在地用作YBa_2Cu_3O_(7-sigma)(YBCO)涂层导体的缓冲层。

著录项

  • 来源
    《Journal of Materials Research》 |2006年第3期|p.767-773|共7页
  • 作者单位

    Chemical Sciences Divison, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6100;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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