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首页> 外文期刊>Journal of Materials Research >Transmission electron microscopy study of (103)-oriented epitaxial SrBi_2Nb_2O_9 films grown on (111) SrTiO_3 and (111) SrRuO_3/(111) SrTiO_3
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Transmission electron microscopy study of (103)-oriented epitaxial SrBi_2Nb_2O_9 films grown on (111) SrTiO_3 and (111) SrRuO_3/(111) SrTiO_3

机译：在（111）SrTiO_3和（111）SrRuO_3 /（111）SrTiO_3上生长的（103）取向外延SrBi_2Nb_2O_9薄膜的透射电子显微镜研究

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摘要

Portions of the same epitaxial (103)-oriented SrBi_2Nb_2O_9 film grown on (111) SrTiO_3 for which we recently reported the highest remanent polarization (P_r) ever achieved in SrBi_2Nb_2O_9 (or SrBi_2TaO_9) films, i.e., P_r=15.7 μC/cm~2, have been characterized Microstructurally by plan-view and cross-sectional transmission electron microscopy (TEM) along three orthogonal viewing directions. SrBi_2Nb_2O_9 grows with its c axis tilted 57 from the substrate surface normal in a three-fold twin structure about the substrate [111], with the growth twins'c axes nominally aligned with the three <100> SrRuO_3 bottom electrode have been studied. Dark-field TEM imaging over a 12 μm~2 Area shows no evidence of second phases (crystalline or amorphous). A high density Of out-of-phase boundaries exists in the films.
机译：在（111）SrTiO_3上生长的同一外延（103）取向SrBi_2Nb_2O_9膜的部分，我们最近报告了在SrBi_2Nb_2O_9（或SrBi_2TaO_9）膜中实现的最高剩余极化（P_r），即P_r = 15.7μC/ cm〜2已经通过沿三个正交观察方向的平面图和截面透射电子显微镜（TEM）对其进行了微结构表征。 SrBi_2Nb_2O_9的c轴从衬底表面垂直倾斜57倍，以围绕衬底的三重孪晶结构生长[111]，研究了生长孪生的c轴名义上与三个<100> SrRuO_3底部电极对齐的情况。在12μm〜2的区域上进行的暗场TEM成像显示没有第二相（结晶或非晶）的迹象。膜中存在高密度的异相边界。

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