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首页> 外文期刊>Journal of Materials Science: Materials in Electronics >ZnO nanocrystalline thin films: a correlation of microstructural, optoelectronic properties
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ZnO nanocrystalline thin films: a correlation of microstructural, optoelectronic properties

机译:ZnO纳米晶体薄膜:微观结构,光电性能的相关性

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摘要

The compositional, structural, microstructural, dc electrical conductivity and optical properties of undoped zinc oxide films prepared by the sol–gel process using a spin-coating technique were investigated. The ZnO films were obtained by 5 cycle spin-coated and dried zinc oxide films followed by annealing in air at 600 °C. The films deposited on the platinum coated silicon substrate were crystallized in a hexagonal wurtzite form. The energy-dispersive X-ray (EDX) spectrometry shows Zn and O elements in the products with an approximate molar ratio. TEM image of ZnO thin film shows that a grain of about 60–80 nm in size is really an aggregate of many small crystallites of around 10–20 nm. Electron diffraction pattern shows that the ZnO films exhibited hexagonal structure. The SEM micrograph showed that the films consist in nanocrystalline grains randomly distributed with voids in different regions. The dc conductivity found in the range of 10−5–10−6 (Ω cm)−1. The optical study showed that the spectra for all samples give the transparency in the visible range.
机译:研究了通过溶胶-凝胶法使用旋涂技术制备的未掺杂氧化锌薄膜的组成,结构,微观结构,直流电导率和光学性质。 ZnO薄膜是通过5个循环旋涂并干燥的氧化锌薄膜,然后在600°C的空气中退火获得的。沉积在涂有铂的硅基板上的薄膜以六方纤锌矿形式结晶。能量色散X射线(EDX)光谱显示产物中的Zn和O元素具有近似的摩尔比。 ZnO薄膜的TEM图像显示,大约60–80 nm的晶粒实际上是许多大约10–20 nm的小晶粒的聚集体。电子衍射图表明,ZnO薄膜呈六边形结构。扫描电镜显微照片表明,薄膜由随机分布在不同区域的纳米晶粒组成。直流电导率范围为10 -5 –10 -6 (Ωcm) -1 。光学研究表明,所有样品的光谱均在可见光范围内具有透明性。

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