Studying electrical transport in carbon nanotubes by conductance atomic force microscopy

Gomez-Navarro C; de Pablo PJ; Gomez-Herrero J

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Studying electrical transport in carbon nanotubes by conductance atomic force microscopy

机译：用电导原子力显微镜研究碳纳米管中的电传输

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An introduction to conductance atomic force microscopy in the context of carbon nanotubes is provided where the main problems and performances of this technique are discussed. The conductance measured in SWNT as a function of the loading force applied by an AFM metallized tip is reported. These experiments allow us to study the process of the electrical contact formation between the tip and the nanotube. This will also lead to a study of the electromechanical properties of nanotubes for radial deformations.

机译：介绍了碳纳米管中电导原子力显微镜的介绍，其中讨论了该技术的主要问题和性能。报道了以SWNT测量的电导率与由AFM金属化尖端施加的加载力的函数。这些实验使我们能够研究尖端与纳米管之间的电接触形成过程。这也将导致对纳米管径向变形的机电性能的研究。

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来源
《Journal of Materials Science. Materials in Electronics》 |2006年第6期|p. 475-482|共8页
作者
Gomez-Navarro C; de Pablo PJ; Gomez-Herrero J;
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作者单位

Univ Autonoma Madrid, Dept Fis Mat Condensada, E-28049 Madrid, Spain;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种 eng
中图分类工程材料学;
关键词
IRRADIATION;

机译：辐照;

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3. Fabrication and atomic force microscopy/friction force microscopy (AFM/FFM) studies of polyacrylamide-carbon nanotubes (PAM-CNTs) copolymer thin films [J] . Xuefeng Li, Wenchao Guan, Haibiao Yan, Materials Chemistry and Physics . 2004,第1期

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4. Comparative study of a coiled carbon nanotube by atomic force microscopy and scanning electron microscopy [C] . P. Simonis, A. Volodin, E. Seynaeve, International Conference on Nanotube . 2000

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Studying electrical transport in carbon nanotubes by conductance atomic force microscopy

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