In situ visualization of local electric field in an ultrasharp tungsten emitter under a low voltage scanning transmission electron microscope

Jun-Ichi Fujita; Yuta Ikeda; Satoshi Okada; Kodai Higashi; Shotaro Nakasawa; Masahiko Ishida; Shinji Matsui

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In situ visualization of local electric field in an ultrasharp tungsten emitter under a low voltage scanning transmission electron microscope

机译：低压扫描透射电子显微镜下超锐利钨发射体中局部电场的原位可视化

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Field emissions from a multiwalled carbon nanotube embedded in a conventional electropolished tungsten probe soften the tip of the tungsten by Joule heating, and the Coulomb attraction to the nanotube finery pulled from the tungsten tip resulted in an ultrasharp apex of the tungsten probe having a curvature of 5 nm radius. We also found that scanning transmission electron microscopy (STEM), when operated at low accelerating voltage, can visualize a local electric field at the probe apex. This local electric field, induced around the probe apex, deflected the primary electron beam of the STEM, producing a dark circular shadow surrounding the probe apex in the STEM image. The authors analyzed the distribution of this local field using a simple Rutherford scattering model.

机译：嵌入传统电抛光钨探针中的多壁碳纳米管的场发射通过焦耳加热软化了钨的尖端，并且库伦对从钨尖端拉出的纳米管细料的库仑吸引力导致了钨探针的超锐尖，其曲率为半径5 nm。我们还发现，在低加速电压下运行时，扫描透射电子显微镜（STEM）可以显示探针顶点处的局部电场。在探针顶点周围感应的局部电场使STEM的主电子束偏转，从而在STEM图像中围绕探针顶点产生了一个深色的圆形阴影。作者使用简单的卢瑟福散射模型分析了该局部场的分布。

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《Journal of Vacuum Science & Technology. B, Microelectronics and Nanometer Structures》 |2007年第6期|p.2624-2627|共4页
作者
Jun-Ichi Fujita; Yuta Ikeda; Satoshi Okada; Kodai Higashi; Shotaro Nakasawa; Masahiko Ishida; Shinji Matsui;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种 eng
中图分类工程物理学;
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专利

1. In-situ Visualization of Local Field Enhancement in an Ultra Sharp Tungsten Emitter under a Low Voltage Scanning Transmission Electron Microscope [J] . Jun-ichi Fujita, Yuta Ikeda, Satoshi Okada, Japanese Journal of Applied Physics. Part 2, Letters & Express Letters . 2007,第20a24期

机译：低压扫描透射电子显微镜下超尖锐钨发射极局部场增强的原位可视化
2. Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission mode [J] . Brodusch Nicolas, Demers Hendrix, Gelle Alexandra, Ultramicroscopy . 2019,第期

机译：电子能量损耗光谱（EELS）具有冷场发射扫描电子显微镜，在传输模式下的低加速电压
3. In-situ Visualization and Two Dimensional Mapping of Local Electric Field at Probe Apex Using Scanning Electron Optical System [J] . Jun-ichi Fujita, Yuta Ikeda, Ikumi Suzuki Japanese journal of applied physics . 2009,第6issue2期

机译：扫描电子光学系统在探针顶点的局部电场的原位可视化和二维映射
4. In-situ visualization of local fields at a sharp tungsten emitter using low-voltage scanning transmission electron microscope [C] . Jun-ichi Fujita, Yuta Ikeda, Toshinari Ichihasi, International Microprocesses and Nanotechnology Conference . 2007

机译：使用低压扫描透射电子显微镜，原位可视化夏季钨发射器处的局部场
5. In situ (Scanning) Transmission Electron Microscope Observations of Energy Storage Nanostructures During Synthesis and Battery Operation. [D] . Parent, Lucas Robert. 2013

机译：合成和电池运行过程中储能纳米结构的原位（扫描）透射电子显微镜观察。
6. Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope [O] . Jordan A. Hachtel, Juan Carlos Idrobo, Miaofang Chi -1

机译：扫描透射电子显微镜中通用探测器的亚埃级电场测量
7. In-situ visualization of local magnetic fields using low-energy electron beam in scanning electron microscope [O] . Yoshida Konomi, Murakami Katsuhisa, Fujita Jun-ichi 2014

机译：在扫描电子显微镜中使用低能电子束原位显示局部磁场

In situ visualization of local electric field in an ultrasharp tungsten emitter under a low voltage scanning transmission electron microscope

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