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首页> 外文期刊>Materials Letters >Structural and electrical properties of P3HT:PCBM/PEDOT:PSS thin films deposited through electrohydrodynamic atomization technique
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Structural and electrical properties of P3HT:PCBM/PEDOT:PSS thin films deposited through electrohydrodynamic atomization technique

机译:电流体雾化技术沉积的P3HT:PCBM / PEDOT:PSS薄膜的结构和电学性质

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摘要

This paper presents the deposition of solution based composite P3HTPCBM thin film on PEDOT:PSS coated ITO substrate via electrohydrodynamic atomization (EHDA) technique. Deposition conditions such as stable cone jet formation, flow rate and applied potential have been investigated. X-ray diffraction anlaysis revealed the presence of P3HT polymer in the as deposited film. Surface morphology investigated using a field emission-scanning electron microscope confirms that a uniform deposition of thin films was achieved. The current-voltage characteristics of the as deposited films show a rectifying behavior. The capacitance-voltage study indicated capacitance of the as deposited thin films depended on the frequency .
机译:本文介绍了通过电流体动力学雾化(EHDA)技术将溶液基复合P3HTPCBM薄膜沉积在PEDOT:PSS涂层的ITO基板上。已经研究了沉积条件,例如稳定的锥形射流形成,流速和施加的电势。 X射线衍射分析显示沉积的薄膜中存在P3HT聚合物。使用场发射扫描电子显微镜研究的表面形态证实了薄膜的均匀沉积。所沉积的膜的电流-电压特性显示出整流行为。电容电压研究表明,所沉积薄膜的电容取决于频率。

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