机译:铜线键合技术的挑战与发展
Jiangsu Key Laboratory of ASCI Design, Nantong University. Nantong 226019, PR China,Nantong Fujitsu Microelectronics Co., Ltd., Nantong 226006, PR China,Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, PR China;
Jiangsu Key Laboratory of ASCI Design, Nantong University. Nantong 226019, PR China,Nantong Fujitsu Microelectronics Co., Ltd., Nantong 226006, PR China;
Jiangsu Key Laboratory of ASCI Design, Nantong University. Nantong 226019, PR China;
Nantong Fujitsu Microelectronics Co., Ltd., Nantong 226006, PR China;
Nantong Fujitsu Microelectronics Co., Ltd., Nantong 226006, PR China;
机译:光电中的引线键合:光电封装对引线键合技术提出了独特的挑战
机译:铜线键合应用技术的发展
机译:使用氩屏蔽技术将金丝键合到铜焊盘的热超声键合工艺的开发
机译:用于多模控制器MOSFET封装的铜夹中首次堆叠模具的电线键合资格挑战和开发
机译:在引线键合技术中,研究低k裸片上直径为0.8密耳(20微米)的金键合引线的球形键合完整性。
机译:基于液体的可重构天线技术:最近的发展挑战和未来
机译:汽车电力电子模块的3D-FE电热 - 热磁模型 - 引线键合和铜夹技术比较