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Radiation damage effects on double-junction GaInP_2/GaAs solar cells

机译:辐射损伤对双结GaInP_2 / GaAs太阳能电池的影响

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摘要

The radiation effects on a double-junction GaInP_2/GaAs solar cell were studied under exposures of 100keV protons, 10MeV protons and 1 MeV electrons, in terms of changes on electrical properties and spectral response. The results indicate that the electrical property degradation of the double-junction GaInP_2/GaAs solar cell under irradiation occurs mainly due to the damage in the GaAs sub-cell. The GaAs sub-cell damage is primarily attributed to the decrease in collection efficiency of the minority carriers coming from its base bottom. It is revealed from the cell behavior under exposure to 100 keV protons irradiation that under the AM0 illumination, there is no obvious damage defected in the tunnel junction between the GaInP_2 and the GaAs sub cells. In addition, the tunnel junction between the GaInP_2 and the GaAs sub-cells is stable and no boundary traps are formed.
机译:研究了在100keV质子,10MeV质子和1 MeV电子暴露下,GaInP_2 / GaAs双结太阳能电池的辐射效应,其电学性质和光谱响应发生了变化。结果表明,在辐照下双结GaInP_2 / GaAs太阳能电池的电性能下降主要是由于GaAs子电池的损坏。 GaAs子电池的损坏主要归因于来自其底部的少数载流子的收集效率下降。从暴露于100 keV质子辐照下的电池行为可以看出,在AM0照射下,GaInP_2和GaAs子电池之间的隧道结没有明显的缺陷缺陷。另外,GaInP_2和GaAs子电池之间的隧道结是稳定的,并且没有形成边界陷阱。

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