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Highly efficient subwavelength imaging in mid-IR range using high dielectric hexagonal lattice photonic crystals

机译:使用高介电六边形格子光子晶体中IR范围高效的亚IR范围内部

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摘要

Two-dimensional hole-type hexagonal lattice photonic crystals with low and high dielectric materials have been investigated for the aim of achieving all-angle negative refraction for subwavelength imaging. Structures composed of Si (ε_(Si) = 12 at IR) and PbTe (ε_(pbTe) = 36 at mid-IR) have been regarded, as sample materials. All-angle negative refraction has been achieved for the TM polarization in the second band under the light line in a broad bandwidth of 26% and 31% for low and high dielectric materials, respectively. The optimized radii for low and high dielectric PCs equal to 0.31a and 0.35a and provide the spatial full width at half maximum of 0.37λ and 0.38λ, respectively. The structures present TE gap in the operating wavelength range, and this feature of the structures can be applied to design polarization beam splitters in integrated space division multiplexing.
机译:已经研究了具有低和高介电材料的二维空穴型六边形晶格光子晶体,以实现亚波长成像的全角负折射。被认为是样品材料的Si(IRε_(Si)= 12处的Si(ε_(Si)= 12 = 12)和PBTE(ε_(PBTE)= 36。对于低频和高介电材料,在光线下的第二带中的第二带中的TM偏振已经实现了全角负折射。用于低和高介电PC的优化的半径等于0.31A和0.35A,并分别以0.37λ和0.38λ的半部最大值提供空间全宽。结构存在于操作波长范围内的TE间隙,并且结构的该特征可以应用于集成空间复用中的偏振束分路器。

著录项

  • 来源
    《Optical engineering》 |2019年第6期|067108.1-067108.6|共6页
  • 作者

    Mansour Zaremanesh; Mina Noori;

  • 作者单位

    Sahand University of Technology Department of Electrical Engineering Tabriz Iran Sahand University of Technology Nano-Optics and Photonics Research Lab Tabriz Iran;

    Sahand University of Technology Department of Electrical Engineering Tabriz Iran Sahand University of Technology Nano-Optics and Photonics Research Lab Tabriz Iran;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    all-angle; negative refraction; subwavelength imaging; mid-infrared;

    机译:全角;负折射;亚波长成像;中红外线;

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