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首页> 外文期刊>Optical Materials >Optical and structural analysis of Eu~3+-doped alumina planar waveguides elaborated by the sol-gel process
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Optical and structural analysis of Eu~3+-doped alumina planar waveguides elaborated by the sol-gel process

机译：溶胶凝胶法制备掺Eu〜3 +的氧化铝平面波导的光学和结构分析

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摘要

Eu~3+ ion-doped Al_2O_3 waveguiding thin films were dip-coated by the sol-gel route. Crack-free films were obtained, about 880 nm thick for 15 layers. According to the results of grazing incidence X-ray diffraction analysis and trans- mission electron microscopy (TEM), the film contains γ-Al_2O_3 nanocrystals in an amorphous surrounding. The re- fractive index determined by m-lines spectroscopy is 1.582 at 543.7 nm. A good agreement between film thicknesses determined by m-lines spectroscopy measurements and TEM observation is obtained. The propagation is good (propagation losses less than 2 db/cm) and waveguide fluorescence spectroscopy (WFS) could be used to register the Eu~3+ fluorescence spectrum, which shows disordered environment for Eu~3+ ions.
机译：通过溶胶-凝胶法对Eu〜3 +离子掺杂的Al_2O_3波导薄膜进行了浸涂。获得了无裂纹的膜，其厚度为约880 nm，共15层。根据掠入射X射线衍射分析和透射电子显微镜（TEM）的结果，该膜在非晶态周围包含γ-Al_2O_3纳米晶体。通过m线光谱法测定的折射率在543.7 nm处为1.582。通过m线光谱测量确定的膜厚与TEM观察得到了很好的一致性。传播良好（传播损失小于2 db / cm），可以使用波导荧光光谱（WFS）记录Eu〜3 +荧光光谱，这表明Eu〜3 +离子的环境混乱。

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