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Refractive index retrieval in the UV range using white light spectral interferometry

机译:使用白光光谱干涉法在紫外范围内检索折射率

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摘要

Continuous refractive index measurement in the UV spectral region and a small part of the Vis region (up to 520 nm) is performed by using white light spectral interferometry. The main limitations of operating in this region are the high dispersion and high absorption. The problems derived from high dispersion are overcome taking the data in several shots, that is, recording several interferograms that must be partially overlapped. Whereas, high absorbers require the use of thinner samples, while still keeping a precise measurement of the sample width. We show the capacity of the technique with well characterized reference materials such as BK7, quartz and deionised water.
机译:通过使用白光光谱干涉仪,在UV光谱区域和Vis区域的一小部分(最高520 nm)中进行连续折射率测量。在该区域中操作的主要限制是高分散性和高吸收性。克服了由高色散引起的问题,可以通过多次拍摄获取数据,即记录必须部分重叠的几个干涉图。然而,高吸收体需要使用更薄的样品,同时仍保持对样品宽度的精确测量。我们用特征鲜明的参考材料(例如BK7,石英和去离子水)展示了该技术的能力。

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