Heterodyne near-ﬁeld scanning optical microscopy with spectrally broad sources

Maxim Abashin* Kazuhiro Ikeda Robert Saperstein and Yeshaiahu Fainman

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Heterodyne near-ﬁeld scanning optical microscopy with spectrally broad sources

机译：外差近场扫描光学显微镜，光谱范围广

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We propose to use low-coherence-length cw optical sources with a broad spectrum in heterodyne near-ﬁeldnscanning microscopy in order to imitate optical pulse propagation and to obtain information about spectrallynvariant properties of nanophotonic components. The dispersion difference in the interferometer arms for ansymmetric acousto-optic modulator arrangement is shown to be negligible over appreciable bandwidths.nDemonstration of the principle of operation and viability of this approach is provided by measurement of thengroup refractive index of a silicon channel waveguide. © 2009 Optical Society of American.

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《Optics Letters》 |2009年第9期|p.1327-1329|共3页
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Maxim Abashin* Kazuhiro Ikeda Robert Saperstein and Yeshaiahu Fainman;
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Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Drive,La Jolla, California 92093-0407, USA* Corresponding author: mabashin@emerald.ucsd.edu;

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1. Heterodyne near-field scanning optical microscopy with spectrally broad sources [J] . Maxim Abashin, Kazuhiro Ikeda, Robert Saperstein, Optics Letters . 2009,第9期

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2. Phase imaging and detection in pseudo-heterodyne scattering scanning near-field optical microscopy measurements [J] . Moreno Camilo, Alda Javier, Kinzel Edward, Applied optics . 2017,第4期

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3. Multi-wavelength heterodyne-detected scattering-type scanning near-field optical microscopy [J] . Jen-You Chu, Tien-Jen Wang, You-Chia Chang Ultramicroscopy . 2008,第4期

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7. Phase imaging and detection in pseudo-heterodyne scattering scanning near-field optical microscopy measurements [O] . Moreno Camilo, Alda Javier, Kinzel Edward, 2017

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Heterodyne near-ﬁeld scanning optical microscopy with spectrally broad sources

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