Heterodyne near-field scanning optical microscopy with spectrally broad sources

Maxim Abashin; Kazuhiro Ikeda; Robert Saperstein; Yeshaiahu Fainman

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Heterodyne near-field scanning optical microscopy with spectrally broad sources

机译：具有光谱广泛来源的外差近场扫描光学显微镜

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We propose to use low-coherence-length cw optical sources with a broad spectrum in heterodyne near-field scanning microscopy in order to imitate optical pulse propagation and to obtain information about spectrally variant properties of nanophotonic components. The dispersion difference in the interferometer arms for a symmetric acousto-optic modulator arrangement is shown to be negligible over appreciable bandwidths. Demonstration of the principle of operation and viability of this approach is provided by measurement of the group refractive index of a silicon channel waveguide.

机译：我们建议在外差近场扫描显微镜中使用具有宽光谱的低相干长度连续波光源，以模拟光脉冲传播并获得有关纳米光子组件光谱变化特性的信息。对称声光调制器布置的干涉仪臂中的色散差异在相当大的带宽内可忽略不计。通过测量硅沟道波导的群折射率来提供这种方法的工作原理和可行性的证明。

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《Optics Letters》 |2009年第9期|共3页
作者
Maxim Abashin; Kazuhiro Ikeda; Robert Saperstein; Yeshaiahu Fainman;
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正文语种 eng
中图分类计量学;
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1. Heterodyne near-field scanning optical microscopy with spectrally broad sources [J] . Maxim Abashin, Kazuhiro Ikeda, Robert Saperstein, Optics Letters . 2009,第9期

机译：具有光谱广泛来源的外差近场扫描光学显微镜
2. Phase imaging and detection in pseudo-heterodyne scattering scanning near-field optical microscopy measurements [J] . Moreno Camilo, Alda Javier, Kinzel Edward, Applied optics . 2017,第4期

机译：伪外差散射扫描近场光学显微镜测量中的相位成像和检测
3. Multi-wavelength heterodyne-detected scattering-type scanning near-field optical microscopy [J] . Jen-You Chu, Tien-Jen Wang, You-Chia Chang Ultramicroscopy . 2008,第4期

机译：多波长外差检测散射型扫描近场光学显微镜
4. Spectral and time resolved scanning near-field microscopy of broad area 405 nm InGaN laser diode dynamics [C] . Harald Braun, Tobias Meyer, Dominik Scholz, International Conference of Nitride Semiconductors . 2008

机译：光谱和时间分辨扫描扫描近场显微镜广域405 nm Ingan激光二极管动力学
5. Electrical and optical characterization of gallium indium phosphide by scanning capacitance and near-field scanning optical microscopy [D] . Leong, Jenn-Kuen 1997

机译：通过扫描电容和近场扫描光学显微镜通过磷化镓铟磷化铟的电气和光学表征
6. Scattering-type scanning near-field optical microscopy with low-repetition-rate pulsed light source through phase-domain sampling [O] . Haomin Wang, Le Wang, Xiaoji G. Xu -1

机译：低重复率脉冲光源通过相域采样的散射型扫描近场光学显微镜
7. Phase imaging and detection in pseudo-heterodyne scattering scanning near-field optical microscopy measurements [O] . Moreno Camilo, Alda Javier, Kinzel Edward, 2017

机译：伪外差散射扫描近场光学显微镜测量中的相位成像和检测
8. Near-Field Scanning Optical Microscope/Atomic Force Microscope with Broad-Band Source for Study of Optical Metamaterials and Nanocircuits. [R] . Engheta, N., Drndic, M., Edwards, B. 2011

机译：具有宽带光源的近场扫描光学显微镜/原子力显微镜，用于研究光学材料和纳米电路。

Heterodyne near-field scanning optical microscopy with spectrally broad sources

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