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Effects of humidity during formation of zinc oxide electron contact layers from a diethylzinc precursor solution

机译：由二乙基锌前体溶液形成氧化锌电子接触层期间的湿度影响

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摘要

This work focuses on the role of humidity in the formation of ZnO thin films from a reactive diethylzinc precursor solution for use as the electron contact layer (ECL) in organic photovoltaic (OPV) devices. This method is well suited for flexible devices because the films are annealed at 120 ℃, making the process compatible with polymer substrates. ZnO films were prepared by spin coating and annealing at different relative humidity (RH) levels. It is found that RH during coating and annealing affects the chemical and physical properties of the ZnO films. Using x-ray photoelectron spectroscopy it is found that increasing RH during the formation steps produces a more stoichiometric oxide and a higher Zn/O ratio. Spectro-scopic ellipsometry data shows a small decrease in the optical band gap with increased humidity, consistent with a more stoichiometric oxide. Kelvin probe measurements show that increased RH during formation results in a larger work function (i.e. further from vacuum). Consistent with these data, but counter to what might be expected, when these ZnO films are used as ECLs in OPV devices those with ZnO ECLs processed in low RH (less stoichiometric) had higher power conversion efficiency than those with high-RH processed ZnO due to improved open-circuit voltage. The increase in open-circuit voltage with decreasing humidity was observed with two different donor polymers and fullerene acceptors, which shows the trend is due to changes in ZnO. The observed changes in open-circuit voltage follow the same trend as the ZnO work function indicating that the increase in open-circuit voltage with decreasing humidity is the result of improved energetics at the interface between the bulk-heterojunction and the ZnO layer due to a vacuum level shift.
机译：这项工作着重于湿度在由反应性二乙基锌前体溶液形成ZnO薄膜中的作用，该溶液用作有机光伏（OPV）器件中的电子接触层（ECL）。此方法非常适合于柔性设备，因为薄膜在120℃退火，从而使该工艺与聚合物基材兼容。通过旋涂和在不同的相对湿度（RH）水平下退火来制备ZnO薄膜。发现在涂覆和退火期间的RH影响ZnO膜的化学和物理性质。使用X射线光电子能谱，发现在形成步骤期间增加RH会产生更多化学计量的氧化物和更高的Zn / O比。椭圆偏振光谱数据表明，随着湿度的增加，光学带隙略有下降，这与化学计量比更高的氧化物一致。开尔文（Kelvin）探针的测量表明，在成型过程中增加的相对湿度会导致较大的功函（即远离真空）。与这些数据一致，但与预期相反，当将这些ZnO膜用作OPV器件中的ECL时，由于在低RH（化学计量比低）下处理的ZnO ECL的功率转换效率高于在高RH处理下的ZnO的功率转换效率。改善开路电压。用两种不同的供体聚合物和富勒烯受体观察到开路电压随湿度的降低而增加，这表明这种趋势是由于ZnO的变化。所观察到的开路电压变化遵循与ZnO功函数相同的趋势，这表明随着湿度的降低，开路电压的增加是由于体积异质结与ZnO层之间的界面处的能量提高而导致的。真空度转换。

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  • 来源
    《Organic Electronics》 |2016年第4期|63-70|共8页
  • 作者

    Scott A. Mauger; K. Xerxes Steirer; Jonas Boe; David P. Ostrowski; Dana C. Olson; Scott R. Hammond;

  • 作者单位

    Chemistry and Nanoscience Center, National Renewable Energy Laboratory, Golden, CO, USA;

    Materials Science Center, National Renewable Energy Laboratory, Golden, CO, USA;

    Chemistry and Nanoscience Center, National Renewable Energy Laboratory, Golden, CO, USA,Department of Electrical Engineering, University of Colorado, Boulder, CO, USA,Friedrich-Alexander University, Erlangen, Germany;

    Department of Electrical Engineering, University of Colorado, Boulder, CO, USA;

    Chemistry and Nanoscience Center, National Renewable Energy Laboratory, Golden, CO, USA;

    SolarWindow Technologies, Inc., Columbia, MD, USA;

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  • 正文语种 eng
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  • 关键词

    Organic photovoltaics; Zinc oxide; Processing; Humidity; Contact layer;

    机译：有机光伏;氧化锌加工;湿度;接触层;

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