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System-level reliability testing a frequency converter with simultaneous stresses

机译:系统级可靠性同时测试变频器

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摘要

Because the time available for product design is usually much shorter than the projected operating life of the product, accelerated stress testing is commonly used to study the reliability of components, devices or larger systems. Under normal use conditions, products can be subjected to multiple simultaneous stressors. Consequently, it is also useful to use concurrent stresses during reliability testing. However, the combinatory effects of multiple stressors can be quite complex, which complicates failure analysis after testing. The usage of concurrent environmental stresses as a system-level reliability testing method is studied with the help of a frequency converter. The effects of different stresses on the failure modes and on the overall testing time were examined separately and simultaneously. The results show that with concurrent stresses the same kind of failure modes may be observed during testing as in normal service conditions and, more importantly, a significant reduction in testing time could be achieved when compared to that of single stress tests
机译:由于产品设计可用的时间通常比产品的预期使用寿命短得多,因此通常使用加速应力测试来研究组件,设备或大型系统的可靠性。在正常使用条件下,产品可以同时承受多个压力。因此,在可靠性测试期间使用并发压力也很有用。但是,多个压力源的组合效应可能非常复杂,这会使测试后的失效分析变得复杂。在变频器的帮助下,研究了并发环境压力作为系统级可靠性测试方法的使用。分别并同时检查了不同应力对失效模式和整个测试时间的影响。结果表明,在有并发应力的情况下,在测试过程中可能会观察到与正常工作条件下相同的失效模式,更重要的是,与单应力测试相比,可显着减少测试时间

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  • 来源
    《Power Electronics, IET》 |2011年第8期|p.884-890|共7页
  • 作者

    Kiilunen J.; Frisk L.;

  • 作者单位

    Department of Electronics, Tampere University of Technology, P.O. Box 692, Tampere FI-3101, Finland;

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  • 正文语种 eng
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