Scanning probe microscopy has become a well-accepted technology for testing and examining semiconductor or biomolecular nano-devices. A new instrument from Omicron Vakuumphysik GmbH, Taunusstein, Germany, advances the technology of this instrumentation another step by providing measurement and application of both voltage and current with up to four individual probe modules. The modules can be positioned with atomic-scale accuracy to allow multipoint measurement on nanometer-sized areas.
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