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首页> 外文期刊>Review of Scientific Instruments >Low temperature and high magnetic field spectroscopic ellipsometry system
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Low temperature and high magnetic field spectroscopic ellipsometry system

机译：低温高磁场光谱椭圆仪系统

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摘要

We report on the design and implementation of a spectral ellipsometer at near-infrared wavelength (700–1000 nm) for samples placed in high magnetic fields (up to 14 T) at low temperatures (∼4.2 K). The main optical components are integrated in a probe, which can be inserted into a conventional long-neck He dewar and has a very long free-space optical path (∼1.8 m×2). A polarizer-sample-(quarter-wave plate)-rotating analyzer configuration was employed. Two dielectric mirrors, one before and one after the sample in the optical path, helped to reflect the light back to the analyzer and a two-axis piezo-driven goniometer under the sample holder was used to control the direction of the reflected light. Functional test results performed on an intrinsic GaAs wafer and analysis on the random error of the system are shown. We obtained both amplitude and phase ellipsometric spectra simultaneously and observed helicity transformation at energies near the GaAs exciton transitions in the phase spectra. Significant shifts of them induced by magnetic fields were observed and fitted with a simple model. This system will allow us to study the collective magneto-optical response of materials and spatial dispersive exciton-polariton related problems in high external magnetic fields at low temperatures.
机译：我们报告了在低温（〜4.2 K）下放置在高磁场（高达14 T）中的样品在近红外波长（700–1000 nm）处的光谱椭圆仪的设计和实现。主要光学组件集成在一个探头中，可以插入常规的长颈He杜瓦瓶中，并具有很长的自由空间光路（〜1.8 m×2）。使用偏振器-样品-（四分之一波片）旋转分析仪结构。样品在光路上有两个介电镜，一个在样品前，一个在后，有助于将光反射回分析仪，样品架下方的两轴压电驱动测角仪用于控制反射光的方向。显示了在本征GaAs晶圆上执行的功能测试结果以及对系统随机误差的分析。我们同时获得了振幅和相位椭圆偏振光谱，并观察到在相图中GaAs激子跃迁附近的能量处的螺旋度变换。观察到它们由磁场感应的显着位移，并用简单模型拟合。该系统将使我们能够研究材料的集体磁光响应以及在低温下高外部磁场中与空间色散激子极化相关的问题。

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