Four Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin Films

Cooper R. A.; Lerner E.

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Four Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin Films

机译：四点汞接触探针，用于薄膜电阻率测量

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来源
《Review of Scientific Instruments》 |1968年第8期|共2页
作者
Cooper R. A.; Lerner E.;
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作者单位

Materials Research, Central Research Division, The National Cash Register Company, Dayton, Ohio 45409;

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正文语种 eng
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8. A computer program to calculate the resistivity of a thin film deposited on a conductive substrate from four-point probe measurements [R] . Oberle, L. G., Fralick, G. C. 1986

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Four Point Mercury Contact Probe for Electrical Resistivity Measurements of Thin Films

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