机译:使用扫描白光干涉仪测量薄膜厚度
Centre for Renewable Energy Systems Technology, (CREST), School of Electronic, Electrical and Systems Engineering, Loughborough University, Leicestershire LE11 3TU, UK;
Centre for Renewable Energy Systems Technology, (CREST), School of Electronic, Electrical and Systems Engineering, Loughborough University, Leicestershire LE11 3TU, UK;
Centre for Renewable Energy Systems Technology, (CREST), School of Electronic, Electrical and Systems Engineering, Loughborough University, Leicestershire LE11 3TU, UK;
Scanning White Light Interferometry; Coherence correlation interferometry; Thin film; Metrology; Thin film thickness; Surface roughness; Helical complex field; Ellipsometry;
机译:垂直扫描白光干涉法测量薄膜厚度的灵敏度分析
机译:白光扫描干涉法测量透明薄膜层的厚度轮廓
机译:通过扫描白光干涉仪对有机薄膜进行超薄成像
机译:用于薄膜层厚度测量的白光扫描干涉仪
机译:图像扫描椭圆仪的设计,开发和应用,用于测量薄膜厚度轮廓。
机译:基于横向扫描白色光干涉测量的集成散斑的位移测量
机译:使用扫描白光干涉仪测量薄膜厚度
机译:多光束干涉法测量薄膜厚度