...
首页> 外文期刊>Thin Solid Films >Laser annealing of hydrogenated amorphous silicon-carbon films
【24h】

Laser annealing of hydrogenated amorphous silicon-carbon films

机译:氢化非晶硅碳膜的激光退火

获取原文
获取原文并翻译 | 示例
           

摘要

Hydrogenated amorphous silicon-carbon films with carbon content, x = C/(C + Si), ranging from 0.08 to 0.28 have been irradiated by excimer (KrF) laser varying the incident energy density, Φ, from 64 to 242 ml/cm~2. The crystallization of the silicon phase is induced in all the samples, independently of the alloy composition and the average Si crystallite size increases with the laser energy density. Cubic SiC crystallites, sized 200-450 A, are only detectable in samples with x ≥ 0.18 irradiated at Φ≥ 188 mJ/cm~2. The structural and electrical properties of the laser treated films have been investigated. After crystallization all films show a noticeable increase in dark conductivity.
机译:准分子(KrF)激光辐照了碳含量为x = C /(C + Si)在0.08至0.28之间的氢化非晶硅碳膜,其入射能量密度Φ从64至242 ml / cm〜 2。在所有样品中均会诱发硅相的结晶,而与合金成分无关,并且平均硅微晶尺寸随激光能量密度的增加而增加。仅在Φ≥188 mJ / cm〜2的x≥0.18的样品中才能检测到大小为200-450 A的立方SiC微晶。已经研究了激光处理的膜的结构和电性能。结晶后,所有膜均显示出暗电导率的显着增加。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号