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首页> 外文期刊>IEEE transactions on very large scale integration (VLSI) systems >Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside Tests
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Transition Fault Simulation Considering Broadside Tests as Partially-Functional Broadside Tests

机译：将宽边测试视为部分功能的宽边测试的过渡故障模拟

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摘要

The scan-in states of functional broadside tests are reachable states, which are states that the circuit can enter during functional operation. This is used for ensuring functional operation conditions during the functional clock cycles of the tests. For a partially-functional broadside test, the scan-in state has a known Hamming distance to a reachable state. This ensures measurable deviations from functional operation conditions during the functional clock cycles of the test. It is important for addressing overtesting as well as excessive power dissipation. This brief develops a fault-simulation procedure for transition faults under arbitrary (functional and nonfunctional) broadside tests that considers the tests as partially-functional broadside tests. The procedure can be used for evaluating the proximity to functional operation conditions of arbitrary broadside test sets. For illustration, the procedure is used for comparing a low-power test set with an arbitrary broadside test set.
机译：功能性侧面测试的扫描状态为可达状态，即电路在功能性操作期间可以进入的状态。这用于确保测试的功能时钟周期内的功能操作条件。对于部分功能的宽边测试，扫描状态具有到可到达状态的已知汉明距离。这样可以确保在测试的功能时钟周期内与功能操作条件的可测量偏差。这对于解决过度测试以及功耗过大非常重要。本简介为任意（功能和非功能）侧面测试下的过渡故障开发了一个故障模拟程序，将该程序视为部分功能的侧面测试。该程序可用于评估任意宽边测试仪与功能操作条件的接近程度。为了说明起见，该过程用于将低功率测试仪与任意宽边测试仪进行比较。

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