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首页> 外文期刊>Plant Disease >Modeling of Yield Losses Caused by Potato Late Blight on Eight Cultivars with Different Levels of Resistance to Phytophthora infestans
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Modeling of Yield Losses Caused by Potato Late Blight on Eight Cultivars with Different Levels of Resistance to Phytophthora infestans

机译：不同晚疫病抗性水平上八个品种马铃薯晚疫病造成的产量损失模型

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摘要

The Shtienberg model for predicting yield loss caused by Phytophthora infestans in potato was developed and parameterized in the 1990s in North America. The predictive quality of this model was evaluated in France for a wide range of epidemics under different soil and weather conditions and on cultivars different than those used to estimate its parameters. A field experiment was carried out in 2006, 2007, 2008, and 2009 in Brittany, western France to assess late blight severity and yield losses. The dynamics of late blight were monitored on eight cultivars with varying types and levels of resistance. The model correctly predicted relative yield losses (efficiency = 0.80, root mean square error of prediction = 13.25%, and bias = 0.36%) as a function of weather and the observed disease dynamics for a wide range of late blight epidemics. In addition to the evaluation of the predictive quality of the model, this article provides a dataset that describes the development of various late blight epidemics on potato as a function of weather conditions, fungicide regimes, and cultivar susceptibility. Following this evaluation, the Shtienberg model can be used with confidence in research and development programs to better manage potato late blight in France.
机译：用于预测马铃薯疫霉菌致马铃薯产量损失的Shtienberg模型于1990年代在北美开发并参数化。在法国，该模型的预测质量在不同土壤和天气条件下以及与用于估计其参数的品种不同的品种上，针对广泛的流行病进行了评估。 2006年，2007年，2008年和2009年在法国西部的布列塔尼进行了田间试验，以评估晚疫病的严重程度和产量损失。在八个具有不同类型和水平抗性的品种上监测了晚疫病的动态。该模型正确预测了相对产量损失（效率= 0.80，预测的均方根误差= 13.25％，偏差= 0.36％）与天气以及在广泛的晚疫病流行中观察到的疾病动态的关系。除了评估模型的预测质量外，本文还提供了一个数据集，该数据集描述了马铃薯上各种晚疫病的流行与天气状况，杀菌剂制度和品种易感性的关系。经过评估，可以在研究和开发计划中放心使用Shtienberg模型，以更好地管理法国马铃薯晚疫病。

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