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首页> 外文期刊>Plasma physics and controlled fusion >Active and passive spectroscopic imaging in the DIII-D tokamak
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Active and passive spectroscopic imaging in the DIII-D tokamak

机译：DIII-D托卡马克中的主动和被动光谱成像

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摘要

Wide-angle, 2D imaging of Doppler-shifted, Balmer alpha (Dα) emission from high energy injected neutrals, charge exchange recombination (CER) emission from neutral beam interaction with thermal ions and fully stripped impurity ions and visible bremsstrahlung (VB) from the core of DIII-D plasmas has been carried out. Narrowband interference filters were used to isolate the specific wavelength ranges of visible radiation for detection by a tangentially viewing, fast-framing camera. Measurements of the Dα emission from fast neutrals injected into the plasma from the low field side reveal the vertical distribution of the beam, its divergence and the variation in its radial penetration with density. Modeling of this emission using both a full Monte Carlo collisional radiative code as well as a simple beam attenuation code coupled to Atomic Data and Analysis Structure emissivity lookup tables yields qualitative agreement, however the absolute magnitudes of the emissivities in the predicted distribution are larger than those measured. Active measurements of carbon CER brightness are in agreement with those made independently along the beam midplane using DIII-D’s multichordal, CER spectrometer system, confirming the potential of this technique for obtaining 2D profiles of impurity density. Passive imaging of VB, which can be inverted to obtain local emissivity profiles, is compared with measurements from both a calibrated filter/photomultiplier array and the standard multichordal CER spectrometer system.
机译：高能注入的中性物产生的多普勒频移的Balmer alpha（Dα）发射的广角2D成像，中性束与热离子以及完全剥离的杂质离子和可见的ms致辐射（VB）相互作用的中性束相互作用产生的电荷交换复合（CER）发射DIII-D等离子体的核心已经完成。窄带干涉滤光片用于隔离可见辐射的特定波长范围，以便通过切线观看的快速成帧相机进行检测。从低电场侧注入等离子体的快速中性粒子对Dα发射的测量揭示了光束的垂直分布，发散以及径向穿透强度随密度的变化。使用完整的蒙特卡洛碰撞辐射代码以及与原子数据和分析结构发射率查询表耦合的简单光束衰减代码对这种发射进行建模可产生定性一致性，但是预测分布中的发射率绝对值大于那些测量。主动测量碳CER亮度与使用DIII-D的多弦CER光谱仪系统沿光束中平面独立进行的测量相一致，证实了该技术在获得2D杂质密度分布图方面的潜力。将VB的被动成像（可以反转以获取局部发射率分布图）与来自校准滤镜/光电倍增管阵列和标准多弦CER光谱仪系统的测量结果进行比较。

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