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Impurity shielding criteria for steady state hydrogen plasmas in the LHD, a heliotron-type device

机译:日光加速器型装置LHD中稳态氢等离子体的杂质屏蔽标准

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摘要

Impurity behavior has so far been investigated in steady state hydrogen plasmas in the Large Helical Device, which is a heliotron-type device and excellent for steady state operation. There was always found to be an impurity accumulation window, as observed before (Nakamura et al 2002 Plasma Phys. Control. Fusion 44 2121, Nakamura et al 2003 Nucl. Fusion 43 219). To clarify the boundary conditions, the dependences of impurity transport on edge plasma parameters are investigated with a database of steady state hydrogen discharges, and the boundary conditions for the impurity accumulation window are discussed. It is found that two different types of impurity screening effects are essential for preventing intrinsic impurities from entering the core plasma. One of them is due to positive radial electric field at the plasma edge on the low collisionality side and the other is impurity retention caused by friction force in the ergodic layer on the high collisionality side. The classification of steady state discharges on n-T space shows that the impurity behavior can be predicted by the impurity shielding criteria based on each empirical scaling.
机译:迄今为止,已经在大型螺旋装置中对稳态氢等离子体中的杂质行为进行了研究,该装置是日光加速器型装置,对于稳态操作非常好。如之前所观察到的,总是发现存在杂质积累窗口(Nakamura等人2002 Plasma Phys.Control.Fusion 44 2121,Nakamura等人2003 Nucl.Fusion 43219)。为了澄清边界条件,利用稳态氢放电数据库研究了杂质迁移对边缘等离子体参数的依赖性,并讨论了杂质积累窗口的边界条件。发现两种不同类型的杂质筛选作用对于防止固有杂质进入核心等离子体至关重要。其中之一是由于在低碰撞性侧的等离子边缘处的正径向电场,而另一个是由于在高碰撞性侧的遍历层中的摩擦力导致的杂质保留。 n-T空间上稳态放电的分类表明,可以基于每个经验标度通过杂质屏蔽标准来预测杂质行为。

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