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Fourier Plane Imaging Microscopy for Detection of Plasmonic Crystals with Periods beyond the Optical Diffraction Limit

机译:傅里叶平面成像显微镜用于检测周期超出光学衍射极限的等离子体晶体

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摘要

Using a simple optical microscope, composed of a plasmonic ultrathin condenser, an objective lens, and a camera, we show that the captured Fourier plane images can provide more information than the real plane images that would be obtained from the corresponding compound microscope. Using this simple Fourier plane imaging approach, we demonstrate that reconstructed non-scanning images of plasmonic crystals with lateral resolution beyond the optical diffraction limit can be obtained.
机译:使用由等离子超薄聚光镜,物镜和照相机组成的简单光学显微镜,我们显示捕获的傅立叶平面图像比从相应的复合显微镜获得的真实平面图像可提供更多的信息。使用这种简单的傅立叶平面成像方法,我们证明可以获得横向分辨率超出光学衍射极限的等离激元晶体的重建非扫描图像。

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