...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Ultramicroscopy >LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a C_s corrector: Comparison with electron precession
【24h】

LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a C_s corrector: Comparison with electron precession

机译：LACDIF，使用LACBED配置和C_s校正器获得的一种新的电子衍射技术：与电子进动的比较

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

By combining the large-angle convergent-beam electron diffraction (LACBED) configuration together with a microscope equipped with a C_s corrector it is possible to obtain good quality spot patterns in image mode and not in diffraction mode as it is usually the case. These patterns have two main advantages with respect to the conventional selected-area electron diffraction (SAED) or microdiffraction patterns. They display a much larger number of reflections and the diffracted intensity is the integrated intensity. These patterns have strong similarities with the electron precession patterns and they can be used for various applications like the identification of the possible space groups of a crystal from observations of the Laue zones or the ab-initio structure identifications. Since this is a defocused method, another important application concerns the analysis of electron beam-sensitive materials. Successful applications to polymers are given in the present paper to prove the validity of this method with regards to these materials.
机译：通过将大角度会聚束电子衍射（LACBED）配置与配备C_s校正器的显微镜组合在一起，可以在图像模式下而不是在通常的衍射模式下获得高质量的光点图案。这些图案相对于常规选择区域电子衍射（SAED）或微衍射图案具有两个主要优点。它们显示出大量的反射，并且衍射强度是积分强度。这些图案与电子进动图案具有很强的相似性，可用于各种应用，例如通过观察Laue区域或从头算结构识别晶体的可能空间群。由于这是一种散焦方法，因此另一个重要的应用涉及电子束敏感材料的分析。本文对聚合物进行了成功的应用，以证明该方法对于这些材料的有效性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号