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Developing a neural network-based run-to-run process controller for chemical-mechanical planarization

机译:开发基于神经网络的运行过程控制器,用于化学机械平面化

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摘要

A new neural network-based run-to-run process control system (NNRtRC) is proposed in this article. The key characteristic of this NNRtRC is that the linear and stationary process estimator and controller in the exponentially weighted moving average (EWMA) run-to-run control scheme are replaced by two multilayer feed-forward neural networks. An efficient learning algorithm inspired by the sliding mode control law is suggested for the neural network-based run-to-run controller. Computer simulations illustrate that the proposed NNRtRC performs better than the EWMA approach in terms of draft suppression and adaptation to environmental change. Experimental results show that the NNRtRC can precisely trace the desired target of material removal rate (MRR) and keep the within wafer non-uniformity (WIWNU) in an acceptable range.
机译:本文提出了一种新的基于神经网络的运行过程控制系统(NNRtRC)。该NNRtRC的关键特征是,在指数加权移动平均值(EWMA)逐次运行控制方案中的线性和平稳过程估计器和控制器被两个多层前馈神经网络代替。针对基于神经网络的运行到运行控制器,提出了一种受滑模控制律启发的高效学习算法。计算机仿真表明,在抑制气流和适应环境变化方面,拟议的NNRtRC的性能优于EWMA方法。实验结果表明,NNRtRC可以精确地跟踪材料去除率(MRR)的所需目标,并将晶圆内不均匀性(WIWNU)保持在可接受的范围内。

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