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Research on perpendicularly magnetized electrolessly plated cobalt alloy films using MFM

机译：利用MFM研究垂直磁化化学镀钴合金膜。

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摘要

Many methods have been used to prepare the high-density perpendicular magnetic recording media. One of them is the electroless plating method. To study its potency for magnetic recording, the film's magnetic structure is to be known, Magnetic force microscope (MFM) is a kind of scanning probe microscope (SPM). By controlling the scanning of a magnetized tip along the surface of the sample, MFM can image the magnetic field near the surface. MFM is widely used in studying magnetic head and magnetic structure of digits on disks, such as the size and shape of the digits, the recording noise of the media, the performance of rewriting arid the capability to record at a high density. The resolution is better than 25 nm. Special processing of the sample isnot necessary before it is imaged, and the sample can even be coated with a non-magnetic layer because the stray field can penetrate it, Perpendicularly magnetized CoNiMnP films have been plated with the electroless method, and their microstructures as well as their magnetic property have been investigated. Moreover, we have imaged and analyzed their domain structures by using MFM.
机译：已经使用了许多方法来制备高密度垂直磁记录介质。其中之一是化学镀方法。为了研究其磁性记录的潜力，已知膜的磁性结构，磁力显微镜（MFM）是一种扫描探针显微镜（SPM）。通过控制沿着样品表面的磁化尖端的扫描，MFM可以对表面附近的磁场成像。 MFM被广泛用于研究磁头和磁盘上数字的磁结构，例如数字的大小和形状，介质的记录噪音，重写性能以及高密度记录的能力。分辨率优于25 nm。在对样品成像之前，无需对样品进行特殊处理;由于杂散场可以穿透样品，因此甚至可以在样品上涂覆非磁性层;采用化学方法镀覆垂直磁化的CoNiMnP膜，以及它们的微结构因为已经研究了它们的磁性。此外，我们已经使用MFM对它们的域结构进行了成像和分析。

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