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首页> 外文期刊>Carbon: An International Journal Sponsored by the American Carbon Society >Correlated high resolution transmission electron microscopy and X-ray photoelectron spectroscopy studies of structured CNx (0 < x < 0.25) thin solid films
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Correlated high resolution transmission electron microscopy and X-ray photoelectron spectroscopy studies of structured CNx (0 < x < 0.25) thin solid films

机译：相关的高分辨率透射电子显微镜和X射线光电子能谱研究结构化CNx（0

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摘要

Structured carbon nitride (CNx), thin solid films, also known as fullerene-like, consist of, upon nitrogen substitution, bent and cross-linked graphene planes. They were synthesized by unbalanced reactive magnetron sputtering and analyzed by high-resolution transmission electron microscopy (HRTEM) in combination with X-ray photoelectron spectroscopy (XPS). The microstructure evolution in terms of plane alignment, extension and cross-linking can be controlled by adjusting the synthesis conditions, such as growth temperature, N-2 fraction in the discharge gas and ion energy. HRTEM on plan-view samples was used to examine the structural changes depending on growth temperature and N-2 fraction. The problem of projection artifacts for imaging the structural features was partially overcome by selected area electron diffraction analysis, where it is shown that diffraction corresponding to 3.5 Angstrom is associated with the formation of structured CNx. The incorporation of N is crucial for the evolution of heavily bent and frequently cross-linked basal planes, since it triggers pentagon formation and cross-linking at much lower energies compared to pure carbon films. Therefore, the two spectral features in the nitrogen Is core electron spectra as examined by XPS were correlated to the microstructure evolution. (C) 2004 Elsevier Ltd. All rights reserved.
机译：结构化的氮化碳（CNx）固态薄膜也称为富勒烯样，由氮取代后的弯曲和交联的石墨烯平面组成。它们是通过不平衡反应磁控溅射合成的，并通过高分辨率透射电子显微镜（HRTEM）和X射线光电子能谱（XPS）进行分析。通过调整合成条件，例如生长温度，放电气体中N-2的比例和离子能，可以控制在平面排列，延伸和交联方面的微观结构演变。平面图样品上的HRTEM用于检查取决于生长温度和N-2分数的结构变化。通过选择区域电子衍射分析部分克服了用于对结构特征进行成像的投影伪像的问题，其中表明对应于3.5埃的衍射与结构化CNx的形成有关。 N的引入对于剧烈弯曲且经常交联的基面的演化至关重要，因为与纯碳膜相比，它以低得多的能量触发五边形的形成和交联。因此，通过XPS检测的氮Is核心电子光谱中的两个光谱特征与微观结构演变相关。 （C）2004 Elsevier Ltd.保留所有权利。

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