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首页> 外文期刊>Zeitschrift fur Kristallographie. Supplement issue >Microstructure study on BN nano-composites using XRD and HRTEM
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Microstructure study on BN nano-composites using XRD and HRTEM

机译:XRD和HRTEM研究BN纳米复合材料的微观结构

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摘要

X-ray diffraction and high-resolution transmission electron microscopy were used for microstructure analysis of the bulk boron nitride (BN) nanocomposites containing the graphitic, wurtzitic and sphaleritic modifications of BN that were produced via high-pressure and high-temperature synthesis. The main tasks of the microstructure analysis were to quan-tify the phase composition of the nanocomposites, to determine the crystallite size and to visualise the atomic ordering at the interfaces between individual nanocrystallites. A particu-lar task of the transmission electron microscopy was to look for possible orientation relation-ships between the nanocrystallites with different crystal structures in order to be able to ex-plain the origin and the role of the high density of microstructure defects in the BN nano-composites.
机译:X射线衍射和高分辨率透射电子显微镜被用于通过高压和高温合成生产的含有氮化硼的石墨,多晶和半球形的氮化硼(BN)纳米复合材料的微观结构分析。微观结构分析的主要任务是量化纳米复合材料的相组成,确定微晶尺寸并可视化单个纳米微晶之间界面处的原子序。透射电子显微镜的一项特殊任务是寻找具有不同晶体结构的纳米微晶之间可能的取向关系,以便能够解释氮化硼中微观结构缺陷的高密度起因和作用。纳米复合材料。

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