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A practical vision on Line Profile Analysis today and in the years to come

机译:当今和未来几年对线剖面分析的实用构想

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Line Profile Analysis [LPA] is a useful tool for diffraction pattern analysis todetermine the microstructure of polycrystalline materials. LPA is not difficult and therefore itis tempting to think that it is simple, but it is complicated and that requires careful operation.Some microstructural phenomena may influence other branches of diffraction analysis likethe determination of crystal structures, of residual stresses and of crystallographic texture. Intoday's practice simple procedures (e.g. Williamson Hall plots) are used widely, and oftenwithout justification to determine crystallite sizes and lattice strains (size-strain analysis)instead of dedicated, rather complicated methods of Line Profile Analysis. It will be pointedout (i) when the use of simple methods is acceptable, (ii) why and when existing rathercomplicated methods shall be used, and which requirements / conditions hold for their use,and (iii) what is the desirable direction of developments.
机译:线轮廓分析[LPA]是一种有用的工具,可用于进行衍射图分析以确定多晶材料的微观结构。 LPA并不难,因此很容易以为它很简单,但却很复杂,需要仔细操作。某些微结构现象可能会影响衍射分析的其他分支,例如晶体结构,残余应力和晶体织构的确定。在当今的实践中,简单的程序(例如Williamson Hall图)被广泛使用,并且通常没有理由确定微晶尺寸和晶格应变(尺寸-应变分析),而不是专用,相当复杂的线轮廓分析方法。需要指出的是:(一)何时可以使用简单的方法;(二)为什么以及何时应当使用现有的相当复杂的方法;以及哪些条件/条件适合使用它们;(三)发展的理想方向是什么? 。

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