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Determination of protein and gluten quality-related parameters of wheat flour using near-infrared reflectance spectroscopy (NIRS)

机译:使用近红外反射光谱法(NIRS)测定面粉的蛋白质和面筋质量相关参数

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摘要

Wet chemistry analyses done for quality control purposes in wheat and flour processing are time-consuming. Near-infrared spectroscopy (NIRS) as an alternative technology to conventional methods allows us to obtain results in a few seconds. In this study, NIRS was used in the development of calibration models for protein, wet and dry gluten contents and Zeleny sedimentation of flours from the grinding of 120 varieties of bread wheat collected from different regions of Turkey. Therefore, spectra in the range of 1100 to 2500 nm of the flours were acquired by scanning with the NIRSystems 6500 monochromator. Multiple linear regression (MLR) and partial least squares (PLS) regression were applied to the spectral data in log 1/R, and first derivative and second derivative of log 1/R formats. Reasonable results were obtained for protein, wet and dry gluten contents, and Zeleny sedimentation with r = 0.985, 0.976, 0.953, and 0.924, respectively.
机译:在小麦和面粉加工中为质量控制目的进行的湿化学分析非常耗时。近红外光谱(NIRS)作为传统方法的替代技术,使我们能够在几秒钟内获得结果。在这项研究中,NIRS用于建立蛋白质模型,湿面筋和干面筋含量以及研磨来自土耳其不同地区的120种面包小麦的面粉的Zeleny沉降校正模型。因此,通过使用NIRSystems 6500单色仪进行扫描,可以得到面粉的1100至2500 nm范围内的光谱。将多元线性回归(MLR)和偏最小二乘(PLS)回归应用于log 1 / R中的光谱数据,以及log 1 / R格式的一阶导数和二阶导数。蛋白质,干和干面筋含量和Zeleny沉降均获得了合理的结果,r分别为0.985、0.976、0.953和0.924。

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