首页> 外文期刊>Journal de Physique, IV: Proceedings of International Conference >Influence of processing parameters on characteristics of sol-gel derived PLZT thin films
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Influence of processing parameters on characteristics of sol-gel derived PLZT thin films

机译:工艺参数对溶胶-凝胶法制备PLZT薄膜特性的影响

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摘要

PLZT x/65/35 (x = 4, 8, 10) thin films were prepared by the acetic-acid based chemical solution deposition processing from lead tetraacetate, lanthanum nitrate and zirconium and titanium propoxides. Introducing top layer of PLZT with large PbO excess can prevent surface pyrochlore phase formation. It is further shown that although lead is depleted from PLZT because of the reaction with the substrate, perovskite phase is retained as a consequence of a large lead-oxide content throughout the film.
机译:PLZT x / 65/35(x = 4、8、10)薄膜是通过乙酸基化学溶液沉积工艺由四乙酸铅,硝酸镧,锆和丙氧化钛制成的。引入过量PbO的PLZT顶层可以防止表面烧绿石相的形成。进一步表明,尽管由于与底物的反应铅从PLZT中耗尽,但由于整个薄膜中大量的氧化铅含量,钙钛矿相得以保留。

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