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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >XPS study on pristine and intercalated tantalum carbosulfide
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XPS study on pristine and intercalated tantalum carbosulfide

机译：原始和插层钽硫化碳的XPS研究

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摘要

Core level and valence band spectra of pristineand Fe, Co, Cu, or Ni intercalated tantalum carbosulfide(Ta_2S_2C) have been studied by X-ray photoelectronspectroscopy. The aim was to compare pristine tantalumcarbosulfide (a layered compound, stacking sequence: S-Ta-C-Ta-S) to tantalum carbides (TaC and Ta_2C) and tantalumsulfide (TaS_2) and compare intercalated with pristinecarbosulfides. The chemical shift of carbon layers in thecarbosulfides was comparable to a graphitic carbon monolayeron (111) faces of TaC. Therefore, the carbon in carbosulfidesdoes not have a carbidic character, it is a single carbon layerwith graphitic character. From an electronic point of view, thecarbosulfides should no longer be called complex carbides.Sulfur and tantalum in the pristine compound showed shiftscomparable to tantalum sulfide. X-ray photoelectron valenceband spectra can be only interpreted as fingerprints. However,intercalated carbosulfides with guests at the octahedral sitesbetween two adjacent sulfur layers (Fe, Co, and Ni) showvalence band spectra distinguishable from Cu intercalatedcompounds (Cu is located in tetragonal sites between sulfur andtantalum layers). Distinguishable from all valence band spectraof intercalated materials is the valence band spectrum of the pristine compound.
机译：通过X射线光电子能谱研究了原始和Fe，Co，Cu或Ni插层的钽硫化碳（Ta_2S_2C）的核能级和价带谱。目的是比较原始的碳氮化钽（一种分层的化合物，堆叠顺序：S-Ta-C-Ta-S）与碳化钽（TaC和Ta_2C）和硫化钽（TaS_2），并与原始的碳硫化硫进行插层比较。碳硫化物中碳层的化学位移与TaC的石墨碳单层（111）面相当。因此，碳硫化物中的碳不具有碳化特性，它是具有石墨特性的单碳层。从电子角度看，碳硫化物不再被称为复合碳化物。原始化合物中的硫和钽显示出可与硫化钽相比的转变。 X射线光电子价带谱只能解释为指纹。然而，在两个相邻的硫层（Fe，Co和Ni）之间的八面体位点处有客体插入的碳硫化物显示出的价带谱不同于Cu插入的化合物（Cu位于硫和钽层之间的四边形位点）。原始化合物的价带谱可与插入材料的所有价带谱区分开。

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