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首页> 外文期刊>Journal of Electronic Testing: Theory and Applications: Theory and Applications >An FPGA-based approach for speeding-up fault injection campaigns on safety-critical circuits
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An FPGA-based approach for speeding-up fault injection campaigns on safety-critical circuits

机译:基于FPGA的方法可加快安全关键电路上的故障注入活动

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摘要

In this paper we describe an FPGA-based approach to speed-up fault injection campaigns for the evaluation of the fault-tolerance of VLSI circuits. Suitable techniques are proposed, allowing emulating the effects of faults and observing faulty behavior. The proposed approach combines the efficiency of hardware-based techniques, and the flexibility of simulation-based techniques. Experimental results are provided showing that significant speedup figures can be achieved with respect to state-of-the-art simulation-based fault injection techniques.
机译:在本文中,我们描述了一种基于FPGA的方法来加快故障注入活动,以评估VLSI电路的容错能力。提出了合适的技术,可以模拟故障的影响并观察故障行为。所提出的方法结合了基于硬件的技术的效率和基于仿真的技术的灵活性。提供的实验结果表明,相对于基于最新模拟的故障注入技术,可以实现显着的加速效果。

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