...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Journal of Low Power Electronics >A Low Power Built-in Self-Test Scheme Based on Overlapping Bit Swapping Linear Feedback Shift Register
【24h】

A Low Power Built-in Self-Test Scheme Based on Overlapping Bit Swapping Linear Feedback Shift Register

机译：基于重叠位交换线性反馈移位寄存器的低功耗内置自测方案

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

In order to reduce test power, a low-transition test pattern generator (TPG) using linear feedback shift register (LFSR), called overlapping bit swapping LFSR(OBS-LFSR), has been presented. The proposed OBS-LFSR is composed of an LFSR, a 2 × 1 multiplexer and a detection module. The proposed OBS-LFSR swaps the last two cells when a detection module detects the state of three successive cells in being 101/010. In this way, the swapped patterns are inserted between the random patterns, and the random nature of the test patterns is kept intact. The goal of inserting swapped patterns is to reduce the transitional activities in primary inputs, which in turn reduces the switching activities inside the circuit under test (CUT). The hardware overhead of the additional circuit logic to the LFSR is negligible compared to the large CUT. The experimental results indicate that the proposed OBS-LFSR achieves up to 11.94% and 17.31% reduction in average and peak power with a little hardware overhead and without compromising the fault coverage compared with the previous scheme.
机译：为了降低测试功率，已经提出了一种使用线性反馈移位寄存器（LFSR）的低过渡测试码型发生器（TPG），称为重叠位交换LFSR（OBS-LFSR）。提出的OBS-LFSR由LFSR，2×1多路复用器和检测模块组成。当检测模块检测到三个连续小区的状态为101/010时，建议的OBS-LFSR交换最后两个小区。以此方式，将交换的图案插入随机图案之间，并且测试图案的随机性质保持完整。插入交换模式的目的是减少主输入中的过渡活动，从而减少被测电路（CUT）内部的开关活动。与大型CUT相比，LFSR的附加电路逻辑的硬件开销可以忽略不计。实验结果表明，与以前的方案相比，所提出的OBS-LFSR的平均功率和峰值功率降低了11.94％和17.31％，而硬件开销却很小。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号