...
首页> 外文期刊>Journal of Low Power Electronics >Test Sequences with Reduced and Increased Switching Activity
【24h】

Test Sequences with Reduced and Increased Switching Activity

机译:开关活动减少和增加的测试序列

获取原文
获取原文并翻译 | 示例
           

摘要

A functional test sequence for a synchronous sequential circuit is applied to the circuit in its functional mode of operation, and the switching activity during the application of the sequence is guaranteed not to exceed that possible during functional operation. It is thus possible to explore functional test sequences with increased switching activity as a way to enhance defect detection. Functional test sequences with decreased switching activity are also important for applications where power dissipation during test application must be limited. We describe a procedure that uses subsequences of a given test sequence to produce two test sequences, one with decreased and one with increased switching activity compared to the given test sequence. Both test sequences achieve the same fault coverage as the given test sequence. We also discuss a static test compaction process based on switching activity that preserves the switching activity of a test sequence.
机译:将同步时序电路的功能测试序列以其功能工作模式应用于该电路,并确保在应用该序列期间的开关活动不会超过功能性操作期间的开关活动。因此有可能探索具有增加的开关活性的功能测试序列,作为增强缺陷检测的一种方法。对于必须限制测试应用功耗的应用,具有降低的开关活动的功能测试序列也很重要。我们描述了一种使用给定测试序列的子序列来生成两个测试序列的过程,与给定测试序列相比,一个测试序列减少了,而一个切换活性增加了。两个测试序列都达到与给定测试序列相同的故障覆盖率。我们还将讨论基于交换活动的静态测试压缩过程,该过程保留测试序列的交换活动。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号