首页> 外文期刊>Journal of Materials Chemistry: An Interdisciplinary Journal dealing with Synthesis, Structures, Properties and Applications of Materials, Particulary Those Associated with Advanced Technology >Chemical vapour deposition of II-VI semiconductor thin films using M[((TePPr2)-Pr-i)(2)N](2) (M = Cd, Hg) as single-source precursors
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Chemical vapour deposition of II-VI semiconductor thin films using M[((TePPr2)-Pr-i)(2)N](2) (M = Cd, Hg) as single-source precursors

机译:以M [(((TePPr2)-Pr-i)(2)N](2)(M = Cd,Hg)作为单源前体的II-VI半导体薄膜的化学气相沉积

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摘要

The aerosol-assisted chemical vapour deposition (AACVD) of CdTe has been carried out using Cd[(TePiPr(2))(2)N](2) at substrate temperatures between 375 and 475 degrees C. XRD shows the formation of cubic CdTe between 425 and 475 degrees C. At low deposition temperature (375 degrees C), a mixture of hexagonal tellurium and cubic cadmium telluride is observed. SEM images reveal that the growth temperatures do not have a profound effect on the morphologies of films. Surface analysis by XPS of films deposited at 475 degrees C showed the growth of Te-rich films. The AACVD of Hg[(TePiPr(2))(2)N](2) resulted in deposition of hexagonal tellurium.
机译:CdTe的气溶胶辅助化学气相沉积(AACVD)已使用Cd [(TePiPr(2))(2)N](2)在375至475摄氏度的基材温度下进行。XRD显示立方CdTe的形成温度在425至475摄氏度之间。在低沉积温度(375摄氏度)下,观察到六方碲和立方碲化镉的混合物。 SEM图像表明,生长温度对膜的形态没有深远的影响。通过XPS对在475摄氏度下沉积的薄膜进行表面分析表明,富Te薄膜的生长。 Hg [(TePiPr(2))(2)N](2)的AACVD导致六方碲的沉积。

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