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Contactless measurements of the photocarrier lifetime in amorphous silicon by a heterodyne experiment

机译:通过外差实验非接触测量非晶硅中的光载流子寿命

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摘要

We describe a heterodyne detection scheme for an optical measurement of the photocarrier lifetime in semiconductors. The setup utilizes the Doppler shift of a laser beam that is diffracted from a periodic modulation of the optical constants of a sample, when it is illuminated with a moving interference grating. The advantage of heterodyne detection is its high sensitivity and the extraction of phase information of the diffracted beam. We present measurements on amorphous hydrogenated silicon. (C) 1998 Elsevier Science B.V. All rights reserved. [References: 8]
机译:我们描述了一种外差检测方案,用于半导体中光载流子寿命的光学测量。当用移动干涉光栅照射样品时,该设置利用了激光束的多普勒频移,该多普勒频移是由样品光学常数的周期性调制引起的。外差检测的优点是它的高灵敏度和衍射光束相位信息的提取。我们提出了对非晶氢化硅的测量。 (C)1998 Elsevier Science B.V.保留所有权利。 [参考:8]

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