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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films
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Comparison of dispersion models in the optical characterization of As-S chalcogenide thin films

机译：As-S硫族化物薄膜光学表征中色散模型的比较

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摘要

In this paper, the optical analysis of the As-S thin films prepared under different conditions is performed using three dispersion models for amorphous materials typically employed in practice. The Tauc-Lorentz (TL) model, Urbach-Cody-Lorentz (UCL) model and our model based on the parameterization of the density of electronic states (PDOS model) are namely used to determine the optical parameters of these films. Within the structural model of the As-S films, the existence of the optical constants profiles and overlayers on to the upper boundaries of these films are included. Dispersion and structural models are employed within the analysis based on a combination of variable angle spectroscopic ellipsometry and transmission spectrophotometry in conjunction with multi-sample modification. It is demonstrated that the TL model is not suitable for the optical characterization of the As-S thin films because of the absence of the Urbach tail. Furthermore, it is shown that both the UCL and PDOS models are satisfactory ones for the optical characterization of these films. Moreover, it is also shown that, using the PDOS dispersion model, one can evaluate the material parameters of these As-S films that correspond to the electronic band structure. (c) 2006 Elsevier B.V. All rights reserved.
机译：在本文中，使用三种通常在实践中使用的非晶态材料的色散模型，对在不同条件下制备的As-S薄膜进行了光学分析。 Tauc-Lorentz（TL）模型，Urbach-Cody-Lorentz（UCL）模型以及我们基于电子态密度参数化的模型（PDOS模型）即用于确定这些薄膜的光学参数。在As-S膜的结构模型中，包括这些膜的上边界上的光学常数轮廓和覆盖层。在分析中采用了色散和结构模型，该模型基于可变角度光谱椭圆仪和透射光谱仪结合多样品修饰的组合。结果表明，由于缺少Urbach尾巴，TL模型不适用于As-S薄膜的光学表征。此外，表明UCL和PDOS模型对于这些膜的光学表征都是令人满意的。此外，还表明，使用PDOS色散模型，可以评估这些与电子能带结构相对应的As-S膜的材料参数。 （c）2006 Elsevier B.V.保留所有权利。

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