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首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >Negative dielectric loss phenomenon in porous sol-gel glasses
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Negative dielectric loss phenomenon in porous sol-gel glasses

机译：多孔溶胶凝胶玻璃的负介电损耗现象

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The broadband dielectric spectroscopy method was employed to investigate glasses of a fine porosity produced via regular and fast sol-gel routes with different catalysts. The study was carried out in the frequency range 20 Hz to I MHz and temperature interval -100 to +300 degrees C. The process discussed in the paper demonstrates unusual dielectric behavior. Dielectric losses of this process are negative, in certain regions of frequency and temperature, and the corresponding real part of the dielectric permittivity increases with increasing frequencies, according to Kramers-Kronig relationships. This exceptional process is located in different temperature regions for each sample. The concentration and type of acids, used as catalysts, influence the amplitude and the temperature-frequency ranges of the negative losses process (NLP). In order to decipher the physical nature of the process, the experimental study has been accompanied by a theoretical one. It was shown that the NLP in the porous sol-get samples can be attributed to the local non-compensated matrix-anchored charges, which accumulate both inside the glassy matrix bulk and on the interface of the pores therein. (c) 2006 Elsevier B.V. All rights reserved.
机译：宽带介电谱法被用来研究通过规则和快速的溶胶-凝胶路线与不同的催化剂产生的细孔玻璃。该研究是在20 Hz至1 MHz的频率范围和-100至+300摄氏度的温度区间内进行的。本文中讨论的过程证明了异常的介电行为。根据Kramers-Kronig关系，该过程的介电损耗在频率和温度的某些区域为负，并且介电常数的相应实部随频率的增加而增加。对于每个样品，此特殊过程位于不同的温度区域。用作催化剂的酸的浓度和类型会影响负损失过程（NLP）的幅度和温度-频率范围。为了解释该过程的物理性质，实验研究伴随着一种理论研究。结果表明，多孔溶胶样品中的NLP可以归因于局部未补偿的基质锚定电荷，这些电荷在玻璃状基质内部以及孔的界面上均累积。 （c）2006 Elsevier B.V.保留所有权利。

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