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Defect levels and charge carrier photogeneration in amorphous selenium layers

机译:非晶硒层中的缺陷水平和载流子的光生

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摘要

Time-of-flight post-transit data that suggested positions in the band gap at similar toE(v) + 0.4 eV and similar toE(c) - 0.55 eV for the thermally accessible levels of the intrinsic negative-U centers of a-Se have been re-examined. The introduction into the Onsager formalism of a distribution of initial carrier separations in the photogeneration process, together with random internal field fluctuations, and of the ensuing processes of bimolecular recombination and deep trapping lead to a good description of experimentally observed photogeneration efficiency in a-Se. (C) 2003 Elsevier B.V. All rights reserved. [References: 11]
机译:飞行时间的传输后数据表明,a-Se固有负U中心的热可及性水平在带隙中的位置类似于E(v)+ 0.4 eV,类似于E(c)-0.55 eV已经重新检查。在Onsager形式论中引入了光生过程中初始载流子分离的分布,内部场的随机波动以及随后的双分子重组和深陷过程,从而很好地描述了a-Se中实验观察到的光生效率。 (C)2003 Elsevier B.V.保留所有权利。 [参考:11]

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